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Showing 1 - 3 of 3 Results
1.
Defect-oriented Testing for Nano-metric Cmos Vlsi Circuits
Defect-oriented Testing for Nano-metric Cmos Vlsi Circuits by Sachdev, Manoj, Pineda De G... ISBN: 9780387465463 List Price: $139.00
$200.78
2.
Integrated Circuit Defect-Sensitivity : Theory and Computational Models
Integrated Circuit Defect-Sensitivity : Theory and Computational Models by Pineda De Gyvez, Jose ISBN: 9781461531593 List Price: $24.99

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3.
Integrated Circuit Defect-Sensitivity: Theory and Computational Models (The Springer Interna...
Integrated Circuit Defect-Sensitivity: Theory and Computational Models (The Springer Interna... by Jose Pineda de Gyvez ISBN: 9781461363835 List Price: $179.00
$101.14 (Save 43%)